STDF to Wafer Bin Map utility written in Python

Python utilities for loading, plotting, and editing wafer defect maps known as KLA Reference Files (KLARFs)

a kibana plugin to visualize the wafer map

This project aims to process 2D images of semiconductor silicon wafers to identify any defects on the wafers as well as their corresponding locations.

산학협력프로젝트: 머신러닝 기반 Wafer Map Defect Pattern Identification

Wafer map defect pattern classification with Multi-Input Neural Network using Convolutioal and Handcrafted Features

SPECTROview : A Tool for Spectroscopic Data Processing and Visualization.

Research-driven wafer defect classification framework combining classical ML and CNN-based approaches, with experimental analysis of few-shot learning under severe class imbalance and limited data regimes.

Utility script for generating wafer-level measurement point layouts with configurable patterns and edge exclusion, designed for semiconductor process development and production workflows.

Mask-aware wafer defect classification using a DenseNet-based CNN with explicit geometry masking and Grad-CAM explainability.

Utility script for visualization of wafer properties from measurement data, intended for wafer evaluation in process development and production workflows.

Wafer Map Defect Classification using Deep Convolutional Neural Networks (CNN) with TensorFlow/Keras on the WM-811K dataset.

Utility script for visualization of wafer properties from measurement data, intended for wafer evaluation in process development and production workflows.

Automatic scratch detection in semiconductor wafer maps using engineered spatial features and XGBoost.